Showing results: 286 - 300 of 648 items found.
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ATE QT2256-640 PXI -
Qmax Test Technologies Pvt. Ltd.
Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.
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XJDirect -
XJTAG Ltd.
XJDirect is an advanced and innovative method for programming the internal flash of your processor and implementing some aspects of board test through JTAG when traditional boundary scan techniques cannot be used.
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Shikino High-Tech Co., Ltd.
We provide you with various inspection equipment mainly for the semiconductor post-production process. Also, "inspection boards", "measurement control" and "test applications" are available for you to meet your various needs.
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EXC-8000cPCI -
Excalibur Systems, Inc.
The board supports up to 6 modules, and each module represents an independent test and simulation device. Most modules are based on existing Excalibur products such as the 1553 Px family and the ARINC429 RxTx.
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K8214A -
Keysight Technologies
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
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K8214B -
Keysight Technologies
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
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K8213A -
Keysight Technologies
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
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K8213B -
Keysight Technologies
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
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cPCI/VME/VME64x -
Kontron
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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EV-SFP-171 -
UC Instruments, Corp.
The purpose of this SFP+ evaluation board is to provide the designer with a convenient means for evaluating SFP+ fiber optic transceiver such as 10 Gb/s(up to 16 Gb/s) SFP/SFP+ transceiver compliant with ANSI Fibre Channel FC‐PI‐5 for high speed electrical and optical specifications. This board provides SMA connectors for high speed TX and RX signals. The low speed control signals such as Tx_Fault, Rx_LOS and Rate_Selects can be controlled by using on board switches and test points. A connector for 2 wire serial interface to the module is also provided.
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1940000377-0000R -
ELMA Electronic, Inc.
The Universal 3U VPX RTM Breakout Board can allow a test engineer to access I/O signals on custom built VPX boards. The breakout board is designed for the utility, power, single ended or low speed differential signals during setup and testing of a new system. During system integration, it often is desirable to access certain utility signals such as VS1, VS2 or VS3, auxiliary voltages other signals such as Geographic address or the system management bus which are all available from the rear side of the backplane.
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IST Engineering, INC.
With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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XJTAG Ltd.
The XJLink2-CFM is an advanced multi-TAP JTAG controller that fits into one of four Custom Function Module (CFM) locations on a Teradyne Multi-Function Application Board. It offers convenient, integrated access to XJTAG’s powerful test and programming tools from Teradyne’s TestStation™ In-Circuit Test Systems.
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HNC Test Fixture -
Circuit Check, Inc.
Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.
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Pilot 4D L4 -
SEICA SpA
The Pilot 4D L4 represents the best solution for those wishing to fully automate the flying probe test process, eliminating the need for continuous operator presence in order to manage the test system. Thanks to its integrated SMEMA conveyor, the Pilot 4D L4 can be combined with automatic load/unload magazines or lines, executing in-circuit, functional and visual tests of electronic boards in a completely automated mode. This is the ideal solution for medium and even high volume production test needs. The large test area can accommodate 21” x 24” boards (540 x 610 mm) board with split test. The ATE rack can be expanded with up to 1032 analog channels, connectable to an optional external bed of nails test fixture (TPM).
